Found 179 matches (page 11 of 18)
Cblock=0.001μF, Bias-Tee=TCBT-14+, Cbypass=0.1μF Fig 2a. Evaluation board TB-678-103+ includes case, connectors
Circuit Die Test Board Vcc (Supply Voltage) Vd Bias-Tee ZX85-12G-S+ BLK-18+ RF-IN RF-OUT 3/5V Cblock=0.001µF, Bias-Tee=TCBT-14+, Cbypass=0.1µF Fig 2a. Simplified SEQ Manufacturer P/N / Value Size A1
Bias-Tee ZX85-12G-S+ BLK-18+ RF-IN RF-OUT DUT 1 2,4 3 +5V L1 RF-IN RF-OUT C2 C3 C1 R1 Vs 1 3 4 2 Bias Tee
(Supply Voltage) Bias-Tee ZX85-12G-S+ BLK-18+ RF-IN RF-OUT +5V Fig 3. Evaluation board TB-733-105+ with
dBm/tone at output. CHARACTERIZATION TEST CIRCUIT RF-IN RF-OUT 3 Vcc (Supply voltage) BLK-18+ Bias-Tee
except DC block BLK-18+ and Bias-Tee ZX85-12G-S+(or Internal Bias-Tee of PNA-X) are not required.
+5V RF IN #2 Supply Voltage Vs Supply Voltage RF-OUT #1 RF-OUT #2 Bias-Tee ZX85-12G-S+ Bias-Tee
at output. RF-IN RF-OUT 3 Vcc (Supply voltage) BLK-18+ Bias-Tee ZX85-12G-S+ 1 DUT TB-313 2,4 +5V
Characterization Test Circuit RF-IN RF-OUT 3 Vcc (Supply voltage) BLK-18+ Bias-Tee ZX85-12G-S+ 1 DUT
spaced 1 MHz apart, 5 dBm/tone at output. RF-IN RF-OUT 3 Vcc (Supply voltage) BLK-18+ Bias-Tee
