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Material Declaration
AN0-39 - Speed IM testing
AN0-40 - Automated compression measurements
AN00-008 - Improved two-tone, third order testing
AN03-36 - Measurement methods
AN40-005 - Prevention and Control of Electrostatic Discharge ESD)
AN40-011 - Handling Moisture Sensitive Devices
AN60-010 - Biasing MMIC Amplifiers (e.g. ERA SERIES)
AN60-034 - Transient Protection of Darlington gain block amplifiers
AN60-036 - MMIC Test Boards: Instructions for Use
AN60-038 - Definition of terms, Q&As
AN60-040 - Understanding Noise Parameter Measurements
DG02-32 - Statistical process control
For detailed questions regarding the performance characteristics and limitations of this product in your intended application, please click Contact Us and we will respond promptly.
PCN08-002 * 07/03/2008 * Tape & Reel Dimension
PCN16-030 * 06/20/2016 * Die /Wafer Change
PCN19-049 * 04/22/2019 * Change of Plating
AN40-012 - dBm - volts - watts conversion table
AN40-013 - The Effect of VSWR on Transmitted Power
DG03-111 - Return loss vs. VSWR table
SPEC1-1 - Overall Noise Figure of Two Stage Amplifier
SPEC1-2 - Insertion Loss Uncertainty Due to Mismatch Calculator
SPEC1-3 - Gain Uncertainty Due to Mismatch Calculator
This is a non-catalog model. If you would like additional sales and technical information regarding this model, please click on "Contact Us" to send your requirements to our Applications help desk.
TB FOR QAT-4+ (CONNECTOR)
EVAL BOARD FOR PAT-10+
EVAL BOARD FOR SPHSA-251+